This paper proposes a new approach based on Lambert W-function to extract the electrical parameters of photovoltaic (PV) panels. This approach can extract the optimal electrical characteristics of the PV panel under variable conditions of irradiation and temperature. Three benchmarking panels (shell SP70 monocrystalline silicon, shell ST40 thin film, and KC200GT Polycrystalline Silicon) are demonstrated and analyzed considering the electrical characteristics provided by the manufacturers. A comprehensive assessment is carried out under different weather condition to validate the capability and the robustness of the proposed approach. Furthermore, the simulated output characteristics of the three modules Photovoltaic are almost comparable and reproduce faithfully the manufacturer’s experimental data The novelty of this study is the using a new hybrid analytical and numerical method that straight forward and effective given value of Root mean square error less than those obtained by others methods that indicate the estimated results are very close to the experimental values provided by the manufacturers.