fully automated approach for patterned fabric defect detection

Faculty Engineering Year: 2016
Type of Publication: ZU Hosted Pages:
Authors:
Journal: 2016 Fourth International Japan-Egypt Conference on Electronics, Communications and Computers (JEC-ECC) Egypt-Japan university for science and technology Volume:
Keywords : fully automated approach , patterned fabric defect    
Abstract:
this paper introduces a fully automated approach for defect detection in patterned fabrics. First, the fabric pattern period is determined by calculating the image mean vectors in both horizontal and vertical directions. Second, Gray Level
   
     
 
       

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